Scratch-related magnetic signal degradation can occur during magnetic storage hard disk drive operations when the read-write heads contact the spinning multilayer disks. To investigate this phenomenon, controlled nanoscratch experiments were performed on perpendicular magnetic recording media using various indenters of different radii of curvature. Various loading conditions were used to cause permanent scratches that were measured using atomic force microscopy. The nanoscratch experiments were simulated using finite element analysis (FEA) that included the detailed nanometer scale thin-film multilayer mechanical properties. The permanently deformed field in the subsurface magnetic recording layer was extracted from the FEA results. The residual scratch widths measured on the surface of the magnetic storage disk were directly compared with the residual subsurface widths of the region on the magnetic recording layer, where extensive permanent lateral deformation was present. It was found that the subsurface widths of the deformed regions were significantly larger than the surface scratch widths. Thus, subsurface thin-film layers, such as the magnetic recording layer, could be damaged without observable damage to the protective top surface carbon overcoat. The exact location and extent of damage to the magnetic recording layer depends on the scratch load, size of scratch tip, and the friction at the interface. Such permanent deformation in magnetic recording layer could lead to demagnetization, which has been reported in the literature.
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e-mail: polycarp@illinois.edu
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April 2010
Research Papers
Experimental and FEA Scratch of Magnetic Storage Thin-Film Disks to Correlate Magnetic Signal Degradation With Permanent Deformation
Raja R. Katta,
Raja R. Katta
Department of Mechanical Science and Engineering,
University of Illinois at Urbana-Champaign
, Urbana, IL 61801
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Andreas A. Polycarpou,
Andreas A. Polycarpou
Department of Mechanical Science and Engineering,
e-mail: polycarp@illinois.edu
University of Illinois at Urbana-Champaign
, Urbana, IL 61801
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Sung-Chang Lee,
Sung-Chang Lee
Samsung Information Systems America
, San Jose, CA 95134
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Mike Suk
Mike Suk
Samsung Information Systems America
, San Jose, CA 95134
Search for other works by this author on:
Raja R. Katta
Department of Mechanical Science and Engineering,
University of Illinois at Urbana-Champaign
, Urbana, IL 61801
Andreas A. Polycarpou
Department of Mechanical Science and Engineering,
University of Illinois at Urbana-Champaign
, Urbana, IL 61801e-mail: polycarp@illinois.edu
Sung-Chang Lee
Samsung Information Systems America
, San Jose, CA 95134
Mike Suk
Samsung Information Systems America
, San Jose, CA 95134J. Tribol. Apr 2010, 132(2): 021902 (11 pages)
Published Online: March 11, 2010
Article history
Received:
March 7, 2009
Revised:
December 2, 2009
Online:
March 11, 2010
Published:
March 11, 2010
Citation
Katta, R. R., Polycarpou, A. A., Lee, S., and Suk, M. (March 11, 2010). "Experimental and FEA Scratch of Magnetic Storage Thin-Film Disks to Correlate Magnetic Signal Degradation With Permanent Deformation." ASME. J. Tribol. April 2010; 132(2): 021902. https://doi.org/10.1115/1.4000848
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