Abstract
A new and simple method is described for the measurement of biaxial deformation with a resolution of 0.025 μm (1 μin.). The basis for this technique is the use of an optical extensometer.
Issue Section:
Research Papers
References
1.
Materials Advisory Board
, “Evaluation Test Methods for Beryllium
,” Report MAB-205-M, National Academy of Sciences, National Research Council
, Washington, DC, 1966
, pp 1
-42
.2.
Murty
, M. V. R. K.
, “Newton, Fizeau and Hardinger Interferometers
,” in Optical Shop Testing
, Malacara
D.
, Ed., Wiley Interscience
, New York
, 1978
, pp. 1
-46
.3.
Den Hartog
, J. P.
, Advanced Strength of Materials
, McGraw-Hill Book Company Inc.
, New York
, 1952
, pp. 119
-140
.4.
Roark
, R. J.
and Young
, W. C.
, Formulas for Stress and Strain
, 5th ed., McGraw-Hill Book Company Inc.
, New York
, 1975
, pp. 366
-367
.5.
Griffel
, W.
, Handbook of Formulas for Stress and Strain
, Frederick Ungar Publishing Co.
, New York
, 1966
, pp. 173
-178
.6.
Pinto
, N. P.
, “Properties
,” in Beryllium Science and Technology Volume 2
, Floyd
D. R.
and Lowe
J. N.
, Eds., Plenum Press
, New York
, 1976
, pp. 332
-333
.7.
Marks
, L. S.
, Standard Handbook for Mechanical Engineers
, McGraw-Hill Book Co.
, New York
, 1978
, p. 55.8.
9.
Tolansky
, S.
, Multiple-Beam Interferometery
, Oxford Press
, Oxford
, 1948
, pp. 284
-312
.
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