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Issues
March 2015
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Review Article
Two-Phase Thermal Ground Planes: Technology Development and Parametric Results
J. Electron. Packag. March 2015, 137(1): 010801.
doi: https://doi.org/10.1115/1.4028890
Topics:
Cooling
,
Copper
,
Flat heat pipes
,
Fluids
,
Heat
,
Heat pipes
,
Silicon
,
Stress
,
Teams
,
Thermal conductivity
Research Papers
Thermo-Electric Modeling of Nanotube-Based Environmental Sensors
J. Electron. Packag. March 2015, 137(1): 011001.
doi: https://doi.org/10.1115/1.4028185
Topics:
Bridges (Structures)
,
Nanotubes
,
Pressure
,
Sensors
,
Temperature
,
Heating
,
Modeling
Simplifying Reliability Testing of Wire Bonds Using On-Chip Heater and Pad Resistance Method
J. Electron. Packag. March 2015, 137(1): 011002.
doi: https://doi.org/10.1115/1.4028281
Topics:
Temperature
,
Wire
Fast and Accurate Evaluation of Cooling in Data Centers
J. Electron. Packag. March 2015, 137(1): 011003.
doi: https://doi.org/10.1115/1.4028315
Topics:
Cooling
,
Data centers
,
Temperature
,
Computational fluid dynamics
Effect of a Slotted Shield on Thermal and Hydraulic Performance of a Heat Sink
J. Electron. Packag. March 2015, 137(1): 011004.
doi: https://doi.org/10.1115/1.4027920
Topics:
Flow (Dynamics)
,
Heat sinks
,
Thermal resistance
,
Pressure drop
On-Chip Power Generation Using Ultrathin Thermoelectric Generators
J. Electron. Packag. March 2015, 137(1): 011005.
doi: https://doi.org/10.1115/1.4027995
Topics:
Electronic packages
,
Energy generation
,
Generators
,
Heat flux
,
Junctions
,
Stress
,
Temperature
,
Waste heat
,
Transients (Dynamics)
Optimization of Thermoelectric Coolers for Hotspot Cooling in Three-Dimensional Stacked Chips
J. Electron. Packag. March 2015, 137(1): 011006.
doi: https://doi.org/10.1115/1.4028254
Topics:
Cooling
,
Optimization
,
Temperature
,
Thermoelectric coolers
Experimental Characterization of Various Cold Aisle Containment Configurations for Data Centers
J. Electron. Packag. March 2015, 137(1): 011007.
doi: https://doi.org/10.1115/1.4028520
Topics:
Air flow
,
Containment
,
Data centers
,
Flow (Dynamics)
,
Stress
,
Temperature
,
Tiles
,
Uncertainty
,
Heat
Compact Model-Based Microfluidic Controller for Energy Efficient Thermal Management Using Single Tier and Three-Dimensional Stacked Pin-Fin Enhanced Microgap
J. Electron. Packag. March 2015, 137(1): 011008.
doi: https://doi.org/10.1115/1.4028574
Topics:
Computational fluid dynamics
,
Control equipment
,
Flow (Dynamics)
,
Fluids
,
Heat
,
Modeling
,
Temperature
,
Thermal management
,
Microfluidics
Comparison of Electronic Component Durability Under Uniaxial and Multiaxial Random Vibrations
J. Electron. Packag. March 2015, 137(1): 011009.
doi: https://doi.org/10.1115/1.4028516
Topics:
Durability
,
Excitation
,
Vibration
,
Inductors
,
Random vibration
,
Printed circuit boards
,
Electronic components
,
Failure
Stress–Strain Behavior of SAC305 at High Strain Rates
J. Electron. Packag. March 2015, 137(1): 011010.
doi: https://doi.org/10.1115/1.4028641
Topics:
Deformation
,
Displacement
,
Failure
,
Finite element analysis
,
Finite element model
,
Lead-free solders
,
Manufacturing
,
Solders
,
Stress
,
Trusses (Building)
Experimental Investigation of Air Flow Through a Perforated Tile in a Raised Floor Data Center
J. Electron. Packag. March 2015, 137(1): 011011.
doi: https://doi.org/10.1115/1.4028835
Topics:
Air flow
,
Tiles
,
Porosity
,
Data centers
Modeling and Experimental Study of a Wire Clamp for Wire Bonding
J. Electron. Packag. March 2015, 137(1): 011012.
doi: https://doi.org/10.1115/1.4028836
Topics:
Clamps (Tools)
,
Wire
,
Wire bonding
Technical Brief
Structural Size Effect on Mechanical Behavior of Intermetallic Material in Solder Joints: Experimental Investigation
J. Electron. Packag. March 2015, 137(1): 014501.
doi: https://doi.org/10.1115/1.4027992
Topics:
Intermetallic compounds
,
Mechanical properties
,
Nanoindentation
,
Solder joints
,
Tin
,
Mechanical behavior
,
Size effect
,
Elastic moduli
,
Yield strength
,
Stress
A New Analytical Method for Calculating Maximum Junction Temperature of Packaged Devices Incorporating the Temperature Distribution at the Base of the Substrate
J. Electron. Packag. March 2015, 137(1): 014502.
doi: https://doi.org/10.1115/1.4028120
Topics:
Temperature
,
Temperature distribution
,
Finite element analysis
,
Junctions
,
Heat
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