Skip Nav Destination
Issues
June 2007
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Interstitial Heat Transfer Coefficient and Dispersion Conductivity in Compressed Metal Foam Heat Sinks
J. Electron. Packag. June 2007, 129(2): 113–119.
doi: https://doi.org/10.1115/1.2721081
Determination of Strain Gradient Plasticity Length Scale for Microelectronics Solder Alloys
J. Electron. Packag. June 2007, 129(2): 120–128.
doi: https://doi.org/10.1115/1.2721082
Topics:
Alloys
,
Nanoindentation
,
Plasticity
,
Solders
,
Strain gradient
,
Microelectronic devices
Convective Cooling of a PCB Like Surface With Mixed Heating Conditions in a Vertical Channel
J. Electron. Packag. June 2007, 129(2): 129–143.
doi: https://doi.org/10.1115/1.2721084
Topics:
Cooling
,
Flow (Dynamics)
,
Heat flux
,
Heating
,
Temperature
,
Convection
,
Wall temperature
,
Heat
Lifetime Estimation of Moems Devices
J. Electron. Packag. June 2007, 129(2): 144–148.
doi: https://doi.org/10.1115/1.2721085
Topics:
Cavities
,
Flow (Dynamics)
,
Leakage
,
Microoptoelectromechanical systems
,
Pressure
,
Water
,
Electrical conductance
A Novel Anisotropic Conductive Adhesive for Lead-Free Surface Mount Electronics Packaging
J. Electron. Packag. June 2007, 129(2): 149–156.
doi: https://doi.org/10.1115/1.2721086
Flow Structure and Enhanced Heat Transfer in Channel Flow With Dimpled Surfaces: Application to Heat Sinks in Microelectronic Cooling
J. Electron. Packag. June 2007, 129(2): 157–166.
doi: https://doi.org/10.1115/1.2721087
Topics:
Channel flow
,
Computer simulation
,
Cooling
,
Design
,
Flow (Dynamics)
,
Friction
,
Heat sinks
,
Heat transfer
,
Reynolds number
,
Geometry
Cross-Verification of Thermal Characterization of a Microcooler
J. Electron. Packag. June 2007, 129(2): 167–171.
doi: https://doi.org/10.1115/1.2721089
Topics:
Cooling
,
Flow (Dynamics)
,
Heat flux
,
Microchannels
,
Microcoolers
,
Sensors
,
Thermal resistance
,
Transients (Dynamics)
,
Heat
,
Transistors
Modeling of Rotary Screw Fluid Dispensing Processes
J. Electron. Packag. June 2007, 129(2): 172–178.
doi: https://doi.org/10.1115/1.2721090
Topics:
Flow (Dynamics)
,
Fluids
,
Screws
,
Needles
A Global–Local Approach for Mechanical Deformation and Fatigue Durability of Microelectronic Packaging Systems
J. Electron. Packag. June 2007, 129(2): 179–189.
doi: https://doi.org/10.1115/1.2721092
Topics:
Deformation
,
Durability
,
Fatigue
,
Fatigue cracks
,
Fatigue life
,
Solder joints
,
Solders
,
Cycles
,
Fracture (Materials)
,
Stress
Pressure Drop of Impingement Air Cooled Plate Fin Heat Sinks
J. Electron. Packag. June 2007, 129(2): 190–194.
doi: https://doi.org/10.1115/1.2721094
Topics:
Flow (Dynamics)
,
Heat sinks
,
Pressure drop
,
Laminar flow
Inelastic Deformation and Fatigue of Solder Alloys Under Complicated Load Conditions
J. Electron. Packag. June 2007, 129(2): 195–204.
doi: https://doi.org/10.1115/1.2721593
Topics:
Alloys
,
Creep
,
Deformation
,
Eutectic alloys
,
Solders
,
Stress
,
Temperature
,
Tin
,
Die cutting
,
Shearing (Deformation)
Air Cooling of Variable Array of Heated Modules in a Vertical Channel
J. Electron. Packag. June 2007, 129(2): 205–215.
doi: https://doi.org/10.1115/1.2721594
Topics:
Computer simulation
,
Convection
,
Cooling
,
Flow (Dynamics)
,
Heat transfer
,
Temperature
,
Printed circuit boards
,
Boundary-value problems
,
Turbulence
,
Heat flux
Technical Brief
Efficient Cooling of Multiple Components in a Shielded Circuit Pack
J. Electron. Packag. June 2007, 129(2): 216–218.
doi: https://doi.org/10.1115/1.2721095
Topics:
Circuits
,
Cooling
,
Gaskets
,
Heat sinks
,
Fins
,
Electromagnetic interference
,
Stress
,
Air flow
,
Flow (Dynamics)
Email alerts
RSS Feeds
Impact of Encapsulated Phase Change Material Additives for Improved Thermal Performance of Silicone Gel Insulation
J. Electron. Packag (December 2024)
Special Issue on InterPACK2023
J. Electron. Packag
Extreme Drop Durability of Sintered Silver Traces Printed With Extrusion and Aerosol Jet Processes
J. Electron. Packag (December 2024)
Experimental Method to Measure High-Temperature Hygroscopic Swelling in Epoxy Mold Compounds and Dielectric Build-Up Films
J. Electron. Packag (March 2025)