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Issues
December 2004
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Foreword
Foreword
J. Electron. Packag. December 2004, 126(4): 409.
doi: https://doi.org/10.1115/1.1827273
Topics:
Heat sinks
,
Packaging
,
Thermal engineering
,
Thermal management
,
Cooling
,
Computer cooling
,
Computers
,
Inventions
,
Design
,
Heat transfer
Research Paper
Optimal Design for PPF Heat Sinks in Electronics Cooling Applications
J. Electron. Packag. December 2004, 126(4): 410–422.
doi: https://doi.org/10.1115/1.1826078
Topics:
Design
,
Heat sinks
,
Optimization
Chimney Effect on Natural Air Cooling of Electronic Equipment Under Inclination
J. Electron. Packag. December 2004, 126(4): 423–428.
doi: https://doi.org/10.1115/1.1827256
Topics:
Cooling
,
Electronic equipment
,
Temperature
,
Natural convection
,
Flow (Dynamics)
,
Computer simulation
Thermal Performance Optimization of Radio Frequency Packages for Wireless Communication
J. Electron. Packag. December 2004, 126(4): 429–434.
doi: https://doi.org/10.1115/1.1827257
Topics:
Heat
,
Junctions
,
Optimization
,
Solders
,
Temperature
,
Thermal conductivity
,
Thermal resistance
,
Epoxy adhesives
,
Epoxy resins
,
Numerical analysis
Thermal Model of a Thinned-Die Cooling System
J. Electron. Packag. December 2004, 126(4): 435–439.
doi: https://doi.org/10.1115/1.1826079
Topics:
Air flow
,
Cooling systems
,
Flat heat pipes
,
Flow (Dynamics)
,
Heat exchangers
,
Temperature
,
Cooling
,
Heat
,
Silicon
A New Role of CFD Simulation in Thermal Design of Compact Electronic Equipment: Application of the Build-up Approach to Thermal Analysis of a Benchmark Model
J. Electron. Packag. December 2004, 126(4): 440–448.
doi: https://doi.org/10.1115/1.1827259
Evaluation of Thermal Enhancements to Flip-Chip-Plastic Ball Grid Array Packages
J. Electron. Packag. December 2004, 126(4): 449–456.
doi: https://doi.org/10.1115/1.1827260
Determination of Temperatures and Heat Fluxes on Surfaces and Interfaces of Multidomain Three-Dimensional Electronic Components
J. Electron. Packag. December 2004, 126(4): 457–464.
doi: https://doi.org/10.1115/1.1827261
Design of Cooling Systems for Electronic Equipment Using Both Experimental and Numerical Inputs
J. Electron. Packag. December 2004, 126(4): 465–471.
doi: https://doi.org/10.1115/1.1827262
Topics:
Computer simulation
,
Cooling systems
,
Design
,
Electronic equipment
,
Flow (Dynamics)
,
Heat
,
Temperature
,
Turbulence
,
Cooling
,
Heat transfer
Development of Compact Models for Electronics Cooling: Using the Multigrid Operator to Generate Reduced-Order Description of Devices
J. Electron. Packag. December 2004, 126(4): 472–476.
doi: https://doi.org/10.1115/1.1827263
Topics:
Capacitance
,
Computer cooling
,
Heat
,
Junctions
,
Linear systems
,
Simulation
,
Steady state
,
Temperature
,
Topology
,
Transients (Dynamics)
Dynamic Reduced Electrothermal Model for Integrated Power Electronics Modules (IPEM)
J. Electron. Packag. December 2004, 126(4): 477–490.
doi: https://doi.org/10.1115/1.1827264
Topics:
Capacitance
,
Electronics
,
Heat transfer
,
Simulation
,
Temperature
,
Thermal analysis
,
Transients (Dynamics)
,
Computer software
,
Heat
,
Design
The Challenges of Electronic Cooling: Past, Current and Future
J. Electron. Packag. December 2004, 126(4): 491–500.
doi: https://doi.org/10.1115/1.1839594
Topics:
Cooling
Cluster of High-Powered Racks Within a Raised-Floor Computer Data Center: Effect of Perforated Tile Flow Distribution on Rack Inlet Air Temperatures
J. Electron. Packag. December 2004, 126(4): 510–518.
doi: https://doi.org/10.1115/1.1827266
Topics:
Data centers
,
Flow (Dynamics)
,
Temperature
,
Tiles
,
Computers
Mixed Convection of Impinging Air Cooling Over Heat Sink in Telecom System Application
J. Electron. Packag. December 2004, 126(4): 519–523.
doi: https://doi.org/10.1115/1.1827267
Topics:
Heat sinks
,
Mixed convection
,
Reynolds number
,
Nozzles
,
Cooling
,
Computer simulation
,
Heat
,
Flow (Dynamics)
,
Rayleigh number
Methodology for an Integrated (Electrical/Mechanical) Design of PWBA
J. Electron. Packag. December 2004, 126(4): 524–527.
doi: https://doi.org/10.1115/1.1827268
An Analytical Study of the Optimized Performance of an Impingement Heat Sink
J. Electron. Packag. December 2004, 126(4): 528–534.
doi: https://doi.org/10.1115/1.1827269
Topics:
Design
,
Flow (Dynamics)
,
Heat sinks
,
Pressure drop
,
Computation
,
Heat transfer
,
Fins
Thermal Performance of Next Generation of Modulated Pump Lasers in Telco Equipment
J. Electron. Packag. December 2004, 126(4): 535–540.
doi: https://doi.org/10.1115/1.1773199
Topics:
Cycles
,
Lasers
,
Pumps
,
Temperature
,
Thermal resistance
Effect of Underfill Entrapment on the Reliability of Flip-Chip Solder Joint
J. Electron. Packag. December 2004, 126(4): 541–545.
doi: https://doi.org/10.1115/1.1756590
Topics:
Bonding
,
Flip-chip
,
Flip-chip devices
,
Flow (Dynamics)
,
Reliability
,
Solder joints
,
Solders
,
Modeling
Experimental and Numerical Thermal Transient Behavior of Chips in a Liquid Channel During Loss of Pumping Power
J. Electron. Packag. December 2004, 126(4): 546–553.
doi: https://doi.org/10.1115/1.1827270
Topics:
Natural convection
,
Steady state
,
Transients (Dynamics)
,
Heat
,
Temperature
,
Flow (Dynamics)
,
Coolants
,
Water
,
Heat transfer
,
Pumps
Impact of TXV and Compressor in the Stability of a High-End Computer Refrigeration System
J. Electron. Packag. December 2004, 126(4): 554–559.
doi: https://doi.org/10.1115/1.1827272
Topics:
Compressors
,
Refrigeration
,
Temperature
,
Stress
,
Computers
,
Stability
,
Vapors
,
Valves
Technical Brief
Effect of Underfill Thermomechanical Properties on Thermal Cycling Fatigue Reliability of Flip-Chip Ball Grid Array
J. Electron. Packag. December 2004, 126(4): 560–564.
doi: https://doi.org/10.1115/1.1827271
Topics:
Ball-Grid-Array packaging
,
Creep
,
Fatigue
,
Flip-chip
,
Materials properties
,
Reliability
,
Solders
,
Thermomechanics
,
Shear (Mechanics)
,
Finite element analysis
Technology Review
Highlights from the European Thermal Project PROFIT
J. Electron. Packag. December 2004, 126(4): 565–570.
doi: https://doi.org/10.1115/1.1827258
Topics:
Modeling
,
Reliability
,
Safety
,
Steady state
,
Temperature
,
Computer software
,
Electronic products
,
Temperature gradient
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