In displacement controlled mechanical fatigue of ball grid solder interconnect arrays, decrease in maximum load monitors total increase in crack area in an array while electrical resistance monitors only the area of large cracks that lead to electrical failure. Small cracks with good electrical contact between the crack surfaces have only minor effect on the resistance of the array. In this mechanical fatigue research of ball grid arrays, the fatigue damage was continually followed by simultaneously measuring maximum load and electrical resistance. Experimental details, results, and analysis of the results are given including a Paris relation fit to the data.
Issue Section:
Research Papers
References
1.
Kanchanomai
, C.
, and Mutoh
, Y.
, 2007
, “Fatigue Crack Initiation and Growth in Solder Alloys
,” Fatigue Fract. Eng. Mater. Struct.
, 30
, pp. 443
–457
.10.1111/j.1460-2695.2006.01088.x2.
Lee
, K. O.
, Yu
, J.
, Park
, T. S.
, and Lee
, S. B.
, 2004
, “Low-Cycle Fatigue Characteristics of Sn-Based Solder Joints
,” J. Electron. Mater.
, 33
(4
), pp. 249
–257
.10.1007/s11664-004-0130-x3.
Subramanian
, K. N.
, and Lee
, J. G.
, 2006
, “Effects of Internal Stresses on the Thermomechanical Fatigue of Sn-Based Solder Joints
,” Mater. Sci. Eng. A
, 421
, pp. 46
–56
.10.1016/j.msea.2005.10.0054.
Mavoori H.
, 1996
, “Mechanical Properties and Fatigue Lifetime Prediction of Solders for Electronic Applications: Tin-Silver and Tin-Zinc Eutectics
,” Ph.D. dissertation, Northwestern University
, Evanston, IL
.5.
Liang
, J.
, Dariavach
, N.
, Barr
, G.
, and Fang
, Z.
, 2006
, “Effects of Strain Rates and Biaxial Stress Conditions on Plastic Yielding and Stress in Solder Alloys
,” J. Electron. Mater.
, 35
(2
) pp. 372
–379
.10.1007/BF026924596.
Li
, D.
, Liu
, C.
, and Conway
, P. P.
, 2006
, “Microstructure and Shear Strength Evolution of Sn-Ag-Cu Solder Bumps During Aging at Different Temperatures
,” J. Electron. Mater.
, 35
(3
) pp. 388
–398
.10.1007/BF026905247.
Song
, F.
, Lee
, S. W. R.
, Newman
, K.
, Sykes
, and Clark
, S.
, 2007
, “Brittle Failure Mechanism of SnAgCu and SnPb Solder Balls During High Speed Ball Shear and Cold Ball Pull Tests
,” IEEE Electronic Components and Technology Conference
, pp. 364
–372
.8.
Zhao
, J.
, Mutoh
, Y.
, Miyashita
, Y.
, and Wang
, S. L.
, 2003
, “Fatigue Crack Growth Behavior of Sn–Pb and Sn-Based Lead-Free Solders
,” Eng. Fract. Mech.
, 70
, pp. 2187
–2197
.10.1016/S0013-7944(02)00252-79.
Pringle
, Raghavan
, and Malatkar
, 2007
, “Solder Joint Reliability of BGA Package Under End-User Handling Test Conditions
,” IEEE Electronic Components and Technology Conference
, pp. 400
–406
.10.
Lau
, J. H.
, 2011
, Reliability of Rohs-Compliant 2D and 3D IC Interconnects
, Electronic Engineering
, McGraw-Hill, New York
, pp. 89
–141
.11.
Fiedler
, B. A.
, 2010
, “Fatigue Failure Kinetics and Structural Changes in Lead-Free Interconnects Due to Mechanical and Thermal Cycling
,” Ph.D. dissertation, Northwestern University
, Evanston, IL
.12.
Paris
, P. C.
, and Erdogan
, F.
, 1963
, “A Critical Analysis of Crack Propagation Laws
,” ASME J. Basic Eng.
85
, pp. 528
–534
.10.1115/1.365690013.
Stolkarts
, V.
, 1999
, “Macrocrack Formation Model With Application to the Fatigue of 63Sn-37Pb Solder
,” Ph.D. dissertation, Northwestern University
, Evanston, IL
.14.
Wu
, J. D.
, Zheng
, P. J.
, Lee
, C. W.
, Hung
, S. C.
, and Lee
, J. J.
, 2006
, “A Study in Flip-Chip UBM/Bump Reliability With Effects of SnPb Solder Composition
,” Microelectron. Reliab.
46
, pp. 41
–52
.10.1016/j.microrel.2005.01.01215.
Kwon
, D.
, Azarian
, M. H.
, and Pecht
, M.
, 2011
, “Non-Destructive Sensing of Interconnect Failure Mechanisms Using Time Domain Reflectometry
,” IEEE Sens. J.
, 11
, pp. 1236
–1241
.10.1109/JSEN.2010.208811816.
Kwon
, D.
, Azarian
, M. H.
, and Pecht
, M.
, 2009
, “Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance
,” IEEE Trans. Device Mater. Reliab.
, 9
, pp. 296
–304
.10.1109/TDMR.2009.202017017.
Kwon
, D.
, Azarian
, M. H.
, and Pecht
, M.
, 2010
, “Prognostics of Interconnect Degradation Using RF Impedance Monitoring and Sequential Probability Ratio Test
,” Int. J. Performability Eng.
, 6
, pp. 443
–452
.18.
Azarian
, M. H.
, Lando
, E.
, and Pecht
, M.
, 2011
, “An Analytical Model of the RF Impedance Change Due to Solder Joint Cracking
,” Fifteenth IEEE Workshop on Signal Propagation on Interconnects
, Naples, Italy
.19.
Practical Components, Inc.
, 2009
, “Dummy Components, Test Boards, Training Kits, Tools and Supplies
,” Product Data Sheets and Drawings, last accessed
Jan
. 1
, 2012
, pp. 24
–78
, http://www.practicalcomponents.com/pdf/Catalog/2009DummyComponentsCatalog.pdf20.
Kariya
, Y.
, and Otsuka
, M.
, 1998
, “Mechanical Fatigue Characteristics of Sn-3.5Ag-X
,” J. Electron. Mater.
, 27
(11
), pp. 1229
–1235
.10.1007/s11664-998-0074-721.
Nemat-Nasser
, S.
, Keer
, L. M.
, Parihar
, K. S.
, 1978
, “Unstable Growth of Thermally Induced Interacting Cracks in Brittle Solids
,” Int. J. Solids Struct.
, 14
, pp. 409
–430
.10.1016/0020-7683(78)90007-022.
Keer
, L. M.
, Nemat-Nasser
, S.
, Oranratnachai
, A.
, 1979
, “Unstable Growth of Thermally Induced Interacting Cracks in Brittle Solids: Further Results
,” Int. J. Solids Struct.
, 15
, pp. 111
–126
.10.1016/0020-7683(79)90016-723.
Liu
, H. W.
, 1985
, “Shear Fatigue Crack Growth: A Literature Survey
,” Fatigue Fract. Eng. Mater. Struct.
, 8
, pp. 295
–313
.10.1111/j.1460-2695.1985.tb00429.x24.
Liaw
, P. K.
, Fine
, M. E.
, and Davidson
, D. L.
, 1980
, “Comparison of Plastic Work of Fatigue Crack Propagation in Low Carbon Steel Measured by Strain Gages and Electron Channeling
,” Fatigue Fract. Eng. Mater. Struct.
, 3
, pp. 59
–74
.10.1111/j.1460-2695.1980.tb01104.x25.
Tanaka
, K.
, and Mura
, T.
, 1981
, “A Dislocation Model for Fatigue Crack Initiation
,” J. Appl. Mech.
, 48
, pp. 97
–103
.10.1115/1.315759926.
Bhat
, S. P.
, and Fine
, M. E.
, 2001
, “Fatigue Crack Nucleation in Iron and a High Strength Steel
,” Mater. Sci. Eng., A
314
, pp. 90
–96
.10.1016/S0921-5093(00)01918-327.
Solomon
, H. D.
, 1989
, “Low-Cycle Fatigue of Surface-Mounted Chip-Carrier Printed Wiring Board Joints
,” IEEE Trans. Compon., Hybrids, Manuf. Technol.
, 12
(4
), pp. 473
–479
.10.1109/33.49004Copyright © 2012 by ASME
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