Pure gold (Au) is used as a bonding medium to bond silicon (Si) chips to alumina substrates. The bonding process is performed at 260 °C with only 150 psi (1.0 MPa) static pressure applied. This is a solid-state bonding without any molten phase involved. The Au layer plated on alumina is ductile enough to deform for its surface to mate with the thin Au layer coated on Si. Au atoms on both sides of the bond line are brought within atomic distance and bonding is achieved. The ductile Au joint also accommodates the significant mismatch in coefficient of thermal expansion (CTE) between Si and alumina. Scanning electron microscope (SEM) evaluations show that nearly perfect joints are achieved and no voids are observed. Five samples are shear tested. They all pass the MIL-STD-883G standard. This bonding technique can be applied to bonding any two objects that can be coated with smooth Au layers. The 260 °C bonding temperature is compatible with typical reflow temperature of Sn3.5Ag solders used in electronic industries.
Skip Nav Destination
Article navigation
June 2011
Research Papers
Low Temperature Solid State Gold Bonding of Si Chips to Alumina Substrates
Chu-Hsuan Sha,
Chu-Hsuan Sha
Electrical Engineering and Computer Science, Materials and Manufacturing Technology,
University of California
, Irvine, Irvine, CA 92697-2660
Search for other works by this author on:
Chin C. Lee
Chin C. Lee
Electrical Engineering and Computer Science, Materials and Manufacturing Technology,
University of California
, Irvine, Irvine, CA 92697-2660
Search for other works by this author on:
Chu-Hsuan Sha
Electrical Engineering and Computer Science, Materials and Manufacturing Technology,
University of California
, Irvine, Irvine, CA 92697-2660
Chin C. Lee
Electrical Engineering and Computer Science, Materials and Manufacturing Technology,
University of California
, Irvine, Irvine, CA 92697-2660J. Electron. Packag. Jun 2011, 133(2): 021003 (5 pages)
Published Online: June 22, 2011
Article history
Received:
October 22, 2010
Revised:
February 26, 2011
Online:
June 22, 2011
Published:
June 22, 2011
Citation
Sha, C., and Lee, C. C. (June 22, 2011). "Low Temperature Solid State Gold Bonding of Si Chips to Alumina Substrates." ASME. J. Electron. Packag. June 2011; 133(2): 021003. https://doi.org/10.1115/1.4003868
Download citation file:
Get Email Alerts
Cited By
Anand Model Constants of Sn–Ag–Cu Solders: What Do They Actually Mean?
J. Electron. Packag (June 2025)
Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag (June 2025)
Related Articles
Liquid Evaporation on Superhydrophobic and Superhydrophilic Nanostructured Surfaces
J. Heat Transfer (August,2011)
Magnetic Force and Thermal Expansion as Failure Mechanisms of Electrothermal MEMS Actuators Under Electrostatic Discharge Testing
J. Appl. Mech (September,2007)
Direct Silver to Copper Bonding Process
J. Electron. Packag (December,2008)
40 μm Silver Flip-Chip Interconnect Technology With Solid-State Bonding
J. Electron. Packag (September,2011)
Related Proceedings Papers
Related Chapters
Design for Displacement Strains
Process Piping: The Complete Guide to ASME B31.3, Fourth Edition
Openings
Guidebook for the Design of ASME Section VIII Pressure Vessels, Third Edition
Openings
Guidebook for the Design of ASME Section VIII Pressure Vessels