A beam model is developed and discretized to study the dynamic behavior of the cantilever probe of an atomic force microscope. Atomic interaction force models are used with a multimode approximation in order to simulate the probe’s response. The system is excited at two-and-a-half times the fundamental frequency and with a dual-frequency signal consisting of the AFM probe’s fundamental frequency and two-and-a-half times the fundamental frequency. A qualitative change in the response in the form of period doubling is observed for the harmonic off-resonance excitation when significantly influenced by repulsive surface forces. Through the use of dual-frequency excitation, standard response characteristics are maintained, while the inclusion of the off-resonance frequency component results in an identifiable qualitative change in the response. By monitoring specific frequency components, the influence of attractive and repulsive surface forces may be distinguished. This information could then be used to distinguish between imaging regimes when bistability occurs or to operate at the separation distance between surface force regimes to minimize force levels.
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e-mail: andrew.j.dick@rice.edu
e-mail: ssolares@umd.edu
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July 2011
Research Papers
Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy
Andrew J. Dick,
Andrew J. Dick
Department of Mechanical Engineering and Materials Science,
e-mail: andrew.j.dick@rice.edu
Rice University
, 6100 Main Street, Houston, TX 77005-1892
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Santiago D. Solares
Santiago D. Solares
Department of Mechanical Engineering, 2181 Glenn L. Martin Hall,
e-mail: ssolares@umd.edu
University of Maryland
, College Park, MD 20742
Search for other works by this author on:
Andrew J. Dick
Department of Mechanical Engineering and Materials Science,
Rice University
, 6100 Main Street, Houston, TX 77005-1892e-mail: andrew.j.dick@rice.edu
Santiago D. Solares
Department of Mechanical Engineering, 2181 Glenn L. Martin Hall,
University of Maryland
, College Park, MD 20742e-mail: ssolares@umd.edu
J. Comput. Nonlinear Dynam. Jul 2011, 6(3): 031005 (12 pages)
Published Online: December 16, 2010
Article history
Received:
July 3, 2009
Revised:
January 10, 2010
Online:
December 16, 2010
Published:
December 16, 2010
Citation
Dick, A. J., and Solares, S. D. (December 16, 2010). "Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy." ASME. J. Comput. Nonlinear Dynam. July 2011; 6(3): 031005. https://doi.org/10.1115/1.4002341
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