Calibrate Piezoresistive Stress Sensors Through the Assembled Structure

[+] Author and Article Information
Ben-Je Lwo

Department of Mechanical Engineering, Chung-Cheng Institute of Technology, National Defense University, Ta-Shi, Tao-Yuan, Taiwan, 335, R. O. C.e-mail: lwob@ccit.edu.tw

Shen-Yu Wu

Department of Weapon System Engineering, Chung-Cheng Institute of Technology, National Defense University, Ta-Shi, Tao-Yuan, Taiwan, 335, R. O. C.

J. Electron. Packag 125(2), 289-293 (Jun 10, 2003) (5 pages) doi:10.1115/1.1572904 History: Received April 30, 2002; Online June 10, 2003
Copyright © 2003 by ASME
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Grahic Jump Location
The configuration of the five-element rosette
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A typical MQFP structure
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Ideal representation (left) and actual 4PB fixture (right)
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Top view of the assembled fixture
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Temperature-resistance relationship for typical resistors
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Stress-resistance relation for a typical rosette
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Piezoresistive coefficients at different temperature



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