Could Shock Tests Adequately Mimic Drop Test Conditions?

[+] Author and Article Information
E. Suhir

Iolon, Inc., San Jose, CA 95131University of Illinois, Chicago, Il 60607e-mail: suhire@aol.com

J. Electron. Packag 124(3), 170-177 (Jul 26, 2002) (8 pages) doi:10.1115/1.1487356 History: Received April 10, 2002; Online July 26, 2002
Copyright © 2002 by ASME
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