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research-article

Reduced Order Modeling of Transient Heat Transfer in Microchip Interconnects

[+] Author and Article Information
Arman Nokhosteen

Department of Mechanical Engineering, K.N. Toosi University of Technology, Tehran, Iran
armannokhosteen@gmail.com

Madjid Soltani

Department of Mechanical Engineering, K.N. Toosi University of Technology, Tehran, Iran; Department of Earth & Environmental Sciences, University of Waterloo, Waterloo, Ontario, Canada; Waterloo Institute for sustainable energy (WISE), University of Waterloo, Waterloo, Ontario, Canada; HVAC&R Management Research Center, Niroo Research Institute, Tehran, Iran
msoltani@uwaterloo.ca

Banafsheh Barabadi

Mechanical Engineering Department, Massachusetts Institute of Technology, Cambridge, USA
bana@mit.edu

1Corresponding author.

ASME doi:10.1115/1.4041666 History: Received April 14, 2018; Revised October 02, 2018

Abstract

The high current densities in today's microelectronic devices and microchips lead to hotspot formations and other adverse effects on their performance. Therefore, a computational tool is needed to not only analyze, but also accurately predict spatial and temporal temperature distribution while minimizing the computational effort within the chip architecture. In this study, a POD-Galerkin projection based reduced order model (ROM) was developed for modeling transient heat transfer in 3D microchip interconnects. COMSOL software was used for producing the required data for ROM and for verifying the results. The developed technique has the ability to provide accurate results for various boundary conditions on the chip and interconnects domain and is capable of providing accurate results for nonlinear conditions where thermal conductivity is temperature dependent. It is demonstrated in this work that a limited number of observations are sufficient for mapping out the entire evolution of temperature field within the domain for transient boundary. Furthermore, the accuracy of the results obtained from the developed ROM and the stability of accuracy over time is investigated. Finally, it is shown that the developed technique provides a 60-fold reduction in simulation time compared to finite element techniques.

Copyright (c) 2018 by ASME
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