0
Research Papers

Experimental Study of Damage Mechanism of Carbon Nanotube as Nanocomponent of Electronic Devices Under High Current Density

[+] Author and Article Information
Kazuhiko Sasagawa

Department of Intelligent Machines and
System Engineering,
Hirosaki University,
3 Bunkyo-cho,
Hirosaki 036-8561, Japan
e-mail: sasagawa@cc.hirosaki-u.ac.jp

Kazuhiro Fujisaki

Department of Intelligent Machines and
System Engineering,
Hirosaki University,
3 Bunkyo-cho,
Hirosaki 036-8561, Japan
e-mail: fujiwax@cc.hirosaki-u.ac.jp

Jun Unuma

Department of Intelligent Machines and
System Engineering,
Hirosaki University,
3 Bunkyo-cho,
Hirosaki 036-8561, Japan
e-mail: sasalab1@cc.hirosaki-u.ac.jp

Ryota Azuma

Department of Intelligent Machines and
System Engineering,
Hirosaki University,
3 Bunkyo-cho,
Hirosaki 036-8561, Japan
e-mail: sasalab2@cc.hirosaki-u.ac.jp

1Corresponding author.

Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received November 1, 2013; final manuscript received February 13, 2014; published online September 19, 2014. Assoc. Editor: Satish Chaparala.

J. Electron. Packag 136(4), 041011 (Sep 19, 2014) (5 pages) Paper No: EP-13-1125; doi: 10.1115/1.4026878 History: Received November 01, 2013; Revised February 13, 2014

The damage mechanisms of carbon nanotubes are considered to be the oxidation by Joule heating and migration of carbon atoms by high-density electron flows. In this study, a high current density testing system was designed and applied to multiwalled carbon nanotubes (MWCNTs) collected at the gap between thin-film electrodes. Local evaporation of carbon atoms occurred on the cathode side of the MWCNTs under relatively low current density conditions, and the center area of the MWCNTs under high current density conditions. The damaged morphology could be explained by considering both Joule heating and electromigration behavior of MWCNTs.

FIGURES IN THIS ARTICLE
<>
Copyright © 2014 by ASME
Your Session has timed out. Please sign back in to continue.

References

Iijima, S., 1991, “Helical Microtubules of Graphitic Carbon,” Nature, 354(6348), pp. 56–58. [CrossRef]
Yokoyama, D., Iwasaki, T., Yoshida, T., and Kawarada, H., 2007, “Low Temperature Grown Carbon Nanotube Interconnects Using Inner Shells by Chemical Mechanical Polishing,” Appl. Phys. Lett., 91(26), p. 263101. [CrossRef]
Yao, Z., Kane, C. L., and Dekker, C., 2000, “High-Field Electrical Transport in Single-Wall Carbon Nanotubes,” Phys. Rev. Lett., 84(13), pp. 2941–2944. [CrossRef] [PubMed]
Begtrup, G. E., Ray, K. G., KesslerB. M., Yuzvinsky, T. D., and Garcia, H., 2007, “Extreme Thermal Stability of Carbon Nanotubes,” Phys. Status Solidi B, 244(11), pp. 3960–3963. [CrossRef]
Collins, P. G., Arnold, M. S., and Avouris, P., 2001, “Engineering Carbon Nanotubes and Nanotube Circuits Using Electrical Breakdown,” Science, 292(5517), pp. 706–709. [CrossRef] [PubMed]
Tsang, S. C., Harris, P. J. F., and Green, M. L. H., 1993, “Thinning and Opening of Carbon Nanotubes by Oxidation Using Carbon Dioxide,” Nature, 362(6420), pp. 520–522. [CrossRef]
Yuzvinsky, T. D., Mickelson, W., Aloni, S., Begtrup, G. E., Kis, A., and Zettl, A., 2006, “Shrinking a Carbon Nanotube,” Nano Lett., 6(12), pp. 2718–2722. [CrossRef] [PubMed]
Jin, C., Suenaga, K., and Iijima, S., 2008, “Plumbing Carbon Nanotubes,” Nat. Nanotechnol., 3(1), pp. 17–21. [CrossRef] [PubMed]
Verma, R., Bhattacharya, S., and Mahapatra, S., 2012, “Theoretical Estimation of Electromigration in Metallic Carbon Nanotubes Considering Self-Heating Effect,” IEEE Trans. Electron Devices, 59(9), pp. 2476–2482. [CrossRef]
Sasagawa, K., Unuma, J., and Abo, T., 2011, “Effect of Oxygen Concentration on Damage Mechanism of Carbon Nanotubes Under High Current Density,” ASME Paper No. IPACK2011-52169. [CrossRef]
Seo, H. W., Han, C. S., Jang, W. S., and Park, J., 2006, “Manipulation of Carbon Nanotubes and Nanowires,” Curr. Appl. Phys., 6(S1), pp. 216–219. [CrossRef]
Sasagawa, K., and Fukushi, S., 2007, “Evaluation of Threshold Current Density of Electromigration Damage in Angled Bamboo Lines,” ASME Paper No. IPACK2007-33237. [CrossRef]
Hasegawa, K., Sasagawa, K., Uno, S., Saka, M., and Abé, H., 2009, “Derivation of Film Characteristic Constants of Polycrystalline Line for Reliability Evaluation Against Electromigration Failure,” Mech. Mater., 41(10), pp. 1090–1095. [CrossRef]
Maruyama, H., Ishibashi, T., Hirahara, K., and Nakayama, Y., 2010, “Carbon Nanotube Sharpening Using an Induced Electrical Current,” Appl. Phys. Express, 3(2), p. 025101. [CrossRef]
Ajayan, P. M., Ebbesen, T. W., Ichihashi, T., Iijima, S., Tanigaki, K., and Hiura, H., 1993, “Opening Carbon Nanotubes With Oxygen and Implications for Filling,” Nature, 362(6420), pp. 522–525. [CrossRef]

Figures

Grahic Jump Location
Fig. 1

Experimental dielectrophoresis set-up

Grahic Jump Location
Fig. 2

Overview of edges of Pt electrodes. Several MWCNT wires are located at the gap area of the electrodes.

Grahic Jump Location
Fig. 3

Experimental DC loading set-up

Grahic Jump Location
Fig. 4

Change in potential drop under each condition

Grahic Jump Location
Fig. 5

SEM images of MWCNT specimens before and after DC loading under (1)

Grahic Jump Location
Fig. 6

SEM images of MWCNT specimens before and after DC loading under (2)

Grahic Jump Location
Fig. 7

Elemental analysis of damaged MWCNT specimens

Grahic Jump Location
Fig. 8

The MWCNT specimen model divided into elements

Grahic Jump Location
Fig. 9

Atomic density distributions along MWCNTs obtained by numerical simulation

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In