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Research Papers

Experimental Study of Damage Mechanism of Carbon Nanotube as Nanocomponent of Electronic Devices Under High Current Density

[+] Author and Article Information
Kazuhiko Sasagawa

Department of Intelligent Machines and
System Engineering,
Hirosaki University,
3 Bunkyo-cho,
Hirosaki 036-8561, Japan
e-mail: sasagawa@cc.hirosaki-u.ac.jp

Kazuhiro Fujisaki

Department of Intelligent Machines and
System Engineering,
Hirosaki University,
3 Bunkyo-cho,
Hirosaki 036-8561, Japan
e-mail: fujiwax@cc.hirosaki-u.ac.jp

Jun Unuma

Department of Intelligent Machines and
System Engineering,
Hirosaki University,
3 Bunkyo-cho,
Hirosaki 036-8561, Japan
e-mail: sasalab1@cc.hirosaki-u.ac.jp

Ryota Azuma

Department of Intelligent Machines and
System Engineering,
Hirosaki University,
3 Bunkyo-cho,
Hirosaki 036-8561, Japan
e-mail: sasalab2@cc.hirosaki-u.ac.jp

1Corresponding author.

Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received November 1, 2013; final manuscript received February 13, 2014; published online September 19, 2014. Assoc. Editor: Satish Chaparala.

J. Electron. Packag 136(4), 041011 (Sep 19, 2014) (5 pages) Paper No: EP-13-1125; doi: 10.1115/1.4026878 History: Received November 01, 2013; Revised February 13, 2014

The damage mechanisms of carbon nanotubes are considered to be the oxidation by Joule heating and migration of carbon atoms by high-density electron flows. In this study, a high current density testing system was designed and applied to multiwalled carbon nanotubes (MWCNTs) collected at the gap between thin-film electrodes. Local evaporation of carbon atoms occurred on the cathode side of the MWCNTs under relatively low current density conditions, and the center area of the MWCNTs under high current density conditions. The damaged morphology could be explained by considering both Joule heating and electromigration behavior of MWCNTs.

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Figures

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Fig. 3

Experimental DC loading set-up

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Fig. 2

Overview of edges of Pt electrodes. Several MWCNT wires are located at the gap area of the electrodes.

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Fig. 1

Experimental dielectrophoresis set-up

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Fig. 8

The MWCNT specimen model divided into elements

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Fig. 9

Atomic density distributions along MWCNTs obtained by numerical simulation

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Fig. 7

Elemental analysis of damaged MWCNT specimens

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Fig. 6

SEM images of MWCNT specimens before and after DC loading under (2)

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Fig. 5

SEM images of MWCNT specimens before and after DC loading under (1)

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Fig. 4

Change in potential drop under each condition

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