0
Research Papers

Accelerated Temperature and Voltage Stress Tests of Embedded Planar Capacitors With Epoxy–BaTiO3 Composite Dielectric

[+] Author and Article Information
Mohammed A. Alam

Center for Advanced Life Cycle Engineering (CALCE),  University of Maryland, College Park, MD 20742aftab.umd@gmail.com

Michael H. Azarian

Center for Advanced Life Cycle Engineering (CALCE),  University of Maryland, College Park, MD 20742mazarian@calce.umd.edu

Michael Osterman

Center for Advanced Life Cycle Engineering (CALCE),  University of Maryland, College Park, MD 20742osterman@calce.umd.edu

Michael Pecht

Center for Advanced Life Cycle Engineering (CALCE),  University of Maryland, College Park, MD 20742pecht@calce.umd.edu

J. Electron. Packag 134(2), 021009 (Jun 11, 2012) (8 pages) doi:10.1115/1.4006704 History: Received October 07, 2011; Revised March 18, 2012; Published June 11, 2012; Online June 11, 2012

Accelerated temperature and voltage stress tests were conducted on embedded planar capacitors with epoxy–BaTiO3 composite dielectric. The failure modes were found to be a sudden increase in the leakage current across the capacitor dielectric and a gradual decrease in the capacitance. The failure mechanisms associated with these failure modes were investigated by performing data analysis and failure analysis. The time-to-failure as a result of a sudden increase in the leakage current was modeled using the Prokopowicz equation. The values of constants of the Prokopowicz equation, n and Ea , were determined for the epoxy–BaTiO3 composite. The degradation in capacitance was modeled by performing regression analysis. The time-to-failure and degradation models can be used for the qualification tests of embedded planar capacitors, for the development of new composite dielectric materials, and to improve the manufacturing processes of these capacitors.

FIGURES IN THIS ARTICLE
<>
Copyright © 2012 by American Society of Mechanical Engineers
Your Session has timed out. Please sign back in to continue.

References

Figures

Grahic Jump Location
Figure 1

Planar capacitor laminate embedded in a PWB

Grahic Jump Location
Figure 2

Test vehicle with group A and group B capacitors

Grahic Jump Location
Figure 3

Cross-sectional view of an embedded planar capacitor

Grahic Jump Location
Figure 4

Breakdown voltage at 85 °C and 125 °C

Grahic Jump Location
Figure 5

Behavior of insulation resistance during aging (of a small capacitor at 125 °C and 285 V)

Grahic Jump Location
Figure 6

Behavior of capacitance during aging (of a large capacitor at 125 °C and 285 V)

Grahic Jump Location
Figure 7

Probability density function of time-to-failure of small capacitors (group A) at 125 °C, 285 V

Grahic Jump Location
Figure 8

Unreliability versus time-to-failure for small capacitors (group A)

Grahic Jump Location
Figure 9

Decrease in capacitance for small capacitors (group A)

Grahic Jump Location
Figure 10

Behavior of aged capacitor (105 °C and 285 V for 2400 h) of group A during heating at a temperature close to the Curie temperature of BaTiO3 (130 °C)

Grahic Jump Location
Figure 11

Sample preparation steps

Grahic Jump Location
Figure 12

Failure site of avalanche breakdown

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In