3D Nonlinear Stress Analysis of Tin Whisker Initiation on Lead-Free Components

[+] Author and Article Information
John H. Lau

Agilent Technologies, Inc., 5301 Stevens Creek Boulevard, Santa Clara, CA 95052

Stephen H. Pan

Optimal Corporation, 6980 Santa Teresa Blvd, Suite 100, San Jose, CA 95119

J. Electron. Packag 125(4), 621-624 (Dec 15, 2003) (4 pages) doi:10.1115/1.1604805 History: Received October 01, 2002; Online December 15, 2003
Copyright © 2003 by ASME
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Focused ion beam (FIB) images taken at various stages of cutting through a matte Sn whisker on a Cu substrate
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Schematic of tin whisker formation mechanisms
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Schematic drawing of the axisymmetric structure for analysis
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Finite element model for analysis (a 7-MPa compression is applied in the Sn layer)
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Displacement vector plot (tin whisker initiated)
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Hydrostatic stress contour
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von Mises equivalent stress contour




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