Residual Stresses in Multilayer Ceramic Capacitors: Measurement and Computation

[+] Author and Article Information
Jaap M. J. den Toonder

Philips Research Laboratories, Eindhoven, The Netherlands

Christian W. Rademaker

Philips Center for Industrial Technology, Eindhoven, The Netherlands

Ching-Li Hu

Phycomp Research and Development Department, Kaohsiung, Taiwan

J. Electron. Packag 125(4), 506-511 (Dec 15, 2003) (6 pages) doi:10.1115/1.1604151 History: Received November 01, 2001; Online December 15, 2003
Copyright © 2003 by ASME
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Schematic drawing of a cross-sectioned MLCC
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Illustration of the plastic imprint and the radial cracks due to indentation with a Vickers indenter. Left: schematic view of the surface and of the cross section; right: micrograph of an actual Vickers indent in our MLCC ceramic. a is the half-diagonal of the plastic imprint, c is the radial crack length, and σrx and σry are stresses in two orthogonal directions, perpendicular to the radial cracks.
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Indentation positions on the cross-sectioned MLCC’s
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MLCC’s top face view, with nine indentations set
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Quarter model of the MLCC, including definition of the coordinate axes
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A typical indentation plot obtained from the experiments
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Left: Computed stress σx after cooling down; only a quarter of the brick is shown (see Fig. 5). Right: path plot of the computed stress component σx along the path indicated in the left figure; the path traces the measurement points on the cross section.




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