0
ADDITIONAL TECHNICAL PAPERS

Near-Threshold Fatigue Crack Growth at 63Sn37Pb Solder Joints

[+] Author and Article Information
Ki-Ju Kang, Seon-Ho Choi

Department of Mechanical Engineering, Chonnam National University, Kwangju 500-757, Republic of Korea

Tae-Sung Bae

Department of Dental Materials and Institute of Oral Bioscience, Chonbuk National University, Chonju 561-756, Republic of Korea

J. Electron. Packag 124(4), 385-390 (Dec 12, 2002) (6 pages) doi:10.1115/1.1510863 History: Received October 12, 2001; Online December 12, 2002
Copyright © 2002 by ASME
Your Session has timed out. Please sign back in to continue.

References

Figures

Grahic Jump Location
Configurations of single-lap-joint specimen
Grahic Jump Location
Schematic diagram of the fatigue test system
Grahic Jump Location
Finite element model of the single-lap-joint specimen
Grahic Jump Location
Variation of mode mix with the crack length under constant load control
Grahic Jump Location
Variation of J-integral with the crack length under constant load control
Grahic Jump Location
Microstructures of the solder in the specimens of (a) series A: air cooled and aged at 150°C/200 h, (b) series B: furnace cooled and aged at room temperature; and (c) series C: furnace cooled and aged at 150°C/200 h  
Grahic Jump Location
Scanning electron micrographs of microstructure near the interface
Grahic Jump Location
Scanning electron micrographs of fatigue crack growth from the pre-crack tip—(a) a general view; (b) and (c) magnified views of the strange rough surface developed on the lateral surface at the initial stage of crack growth
Grahic Jump Location
The main crack path and some micro-cracks developed nearby
Grahic Jump Location
Cracks propagated along the colony boundaries
Grahic Jump Location
A schematic diagram of the three stages of crack propagation near the interface of solder joints
Grahic Jump Location
Experimental results of the fatigue crack growth rate versus ΔJ

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In