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ADDITIONAL TECHNICAL PAPERS

Corrosion Analysis of a Fiber-Optic Transceiver Housing

[+] Author and Article Information
J. H. Lau, C. L. Jiaa, S. J. Erasmus

Agilent Technologies, Inc., San Jose, CA 95131

J. Electron. Packag 124(4), 379-384 (Dec 12, 2002) (6 pages) doi:10.1115/1.1510862 History: Received June 01, 2001; Online December 12, 2002
Copyright © 2002 by ASME
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References

Figures

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A small form pluggable transceiver
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The housing is shown on top; the TOSA, ROSA and ESA are shown in the middle; and the cover is shown in the bottom
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A typical SEM photo of the control coupon (as-machined) at 500X
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In the (as-machined) control coupon, a pore beneath the surface that was opened to the surface by the grinding operation (500X)
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A typical SEM photo of coupons after 85RH/85°C for 14 days (500X)
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A typical SEM photo of the cross-section of coupons after 14 days of 85/85 (160X)
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Cumulative weight change (milligrams) versus exposure time during the 85RH/85°C test
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Cumulative corrosion rate (mils/yr) versus exposure time under the 85RH/85°C test
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A typical eye diagram showing the mask margin of transceivers subjected to 1600 hours of 85RH/85°C test
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A typical SEM photo of corrosion film thickness before the 85RH/85°C test
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A typical SEM photo of corrosion film thickness after 1600 h of 85/85 test
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A typical SEM photo of corrosion film thickness after 1600 h of 85/85 test

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