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TECHNICAL PAPERS

Experimental Investigation of Residual Stresses in Layered Materials Using Moiré Interferometry

[+] Author and Article Information
Keith B. Bowman, David H. Mollenhauer

Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, OH 45433-7750

J. Electron. Packag 124(4), 340-344 (Dec 12, 2002) (5 pages) doi:10.1115/1.1497627 History: Received May 01, 2002; Online December 12, 2002
Copyright © 2002 by ASME
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References

Figures

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Schematic of the MRFEE method specimen (a) Full specimen with diffraction grating on front edge; (b) after the initial cut; and (c) the removal of the layers of the top material
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Comparison of the MLRM and BSAM strain values for the samples with polymer thicknesses of (a) 3.57 mm and (b) 1.66 mm
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Comparison of the MLRM and BSAM stress results for the samples with polymer thicknesses of (a) 3.57 mm and (b) 1.66 mm
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The 5.08-cm×2.54-cm specimen configuration (a) with diffraction grating, (b) after sectioning cut, and (c) with layers removed after milling
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Milling setup with sample and cutter
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Displacement contours on the polymer free edge in the (a) horizontal and (b) vertical fields

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