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PAPERS ON RELIABILITY

Accelerated Life Testing (ALT) in Microelectronics and Photonics: Its Role, Attributes, Challenges, Pitfalls, and Interaction With Qualification Tests

[+] Author and Article Information
E. Suhir

Fellow ASME, University of Illinois at Chicago and ERS Co., 727 Alvine Ct., dos Altos, CA 94024

J. Electron. Packag 124(3), 281-291 (Jul 26, 2002) (11 pages) doi:10.1115/1.1486470 History: Received April 10, 2002; Online July 26, 2002
Copyright © 2002 by ASME
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