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TECHNICAL PAPERS

Review of Models and the Disturbed State Concept for Thermomechanical Analysis in Electronic Packaging

[+] Author and Article Information
Chandra S. Desai, Russell Whitenack

Department of Civil Engineering and Engineering Mechanics, The University of Arizona, Tucson, AZ 85721

J. Electron. Packag 123(1), 19-33 (Jun 30, 2000) (15 pages) doi:10.1115/1.1324675 History: Received June 30, 2000
Copyright © 2001 by ASME
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References

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Figures

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Fractional volume versus cycles for different Nr values for two different disturbance criteria (percentage package failures is based on a total of 4 packages tested)
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Distribution of disturbance from full cycle and accelerated analysis
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Comparison of predicted disturbance distributions at N=4000 for different b values, Nr=10
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Finite element mesh with 256 elements
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Computed stress and disturbance at point A (Fig. 19) for 16, 64, and 256 element meshes. (a) Axial stress versus strain; (b) disturbance versus deviatoric plastic strain trajectory.
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Symbolic representations of DSC
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Yield function F in J2D−J1 stress space
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Disturbance and cyclic behavior
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Relation between ξD,N, and parameter b. (a) Relation between deviatoric strain trajectory, ξD, and cycle number, N; (b) determination of parameter b from finite element analysis.
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Solder element and loading wave forms (Chia and Desai 44)
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Cyclic softening behavior: 60/40 (Sn/Pb) solder γ̇=5 percent and temperature=350 K (Chia and Desai 44)
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Plots of various quantities versus number of cycles: 60/40 (Sn/Pb) solder, shear strain range=±2 percent at typical temperature=350 K (Chia and Desai 44)
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Comparison of the predicted and Solomon’s results for fatigue life of 60/40 (Pb/Sn) solder joints: (a) 300 K, (b) 400 K (Chia and Desai 44)
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Comparison of J-integral and creep-fatigue damage analysis (Ju et al. 29)
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313-PBGA and NASTRAN Model (Zwick and Desai 59)
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Finite element mesh for solder bump in 313-Pin PBGA and cyclic loading (Zwick et al. 58)
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Contours of disturbance and fractional volumes for different criteria (Zwick et al. 58) (percentage package failures is based on a total of 4 packages tested). (a) Contours of disturbance; (b) fractional volume versus cycles
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Fractional volume versus cycles with different number of elements and Nr=10 (percentage package failures is based on a total of 4 packages tested)

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