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SPECIAL SECTION TECHNICAL PAPERS

Solder Joint Formation Simulation and Component Tombstoning Prediction During Reflow

[+] Author and Article Information
X. Wu, X. Dou, C.-P. Yeh, K. Waytt

Applied Simulation and Modeling Research, Corporate Software Center, Motorola, Inc., 1303 E. Algonguin Rd., Mail Drop IL01/AN2, Schaumburg, IL 60196

J. Electron. Packag 120(2), 141-144 (Jun 01, 1998) (4 pages) doi:10.1115/1.2792601 History: Revised January 29, 1997; Received August 12, 1997; Online November 06, 2007

Abstract

The failure of electrical devices associated with solder joints has become one of the most critical reliability issues for surface-mounted devices. Solder joint reliability performance has been found to be highly dependent on the solder joint configuration, which, in turn, is governed by bond pad size, alloy material, and leadframe structure, as well as solder reflow characteristics. To investigate tombstone effects causing solder joint failure during leadless component reflow process, this work has focused on (1) developing a numerical model for the simulations of the solder joint formation during the reflow process, and (2) determining possibility that a tombstone effect for the leadless component may occur by analyzing the force and torque in the problem. Using this methodology, the tombstone effect associated with different pad geometry configurations and solder paste amount has been analyzed through the application of the public domain software tool Surface Evolver. Simulations show that the tombstoning is very sensitive to pad/component geometry design, solder surface tension, solder paste volume, wetting area, and wetting angle. This model simulation can be used to determine optimal solder paste volume, pad geometry configurations, and solder material for avoiding tombstone effects.

Copyright © 1998 by The American Society of Mechanical Engineers
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