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TECHNICAL PAPERS

On Murphy’s Integrated Circuit Yield Integral

[+] Author and Article Information
John H. Lau

Hewlett-Packard Company, 1501 Page Mill Road, Palo Alto, CA 94304

J. Electron. Packag 117(2), 159-164 (Jun 01, 1995) (6 pages) doi:10.1115/1.2792084 History: Received August 01, 1994; Revised March 31, 1995; Online November 06, 2007

Abstract

An approximated closed-form integrated circuit (IC) yield formula based on a Gaussian defect density distribution for the compounder in Murphy’s yield integral is presented. Also, a closed-form solution for the average number of faults (AD0 ) in an IC is obtained for a given IC yield (Y). Furthermore, based on the new IC yield formula a simple equation for determining the number of yielded chips in a wafer is given. Finally, the multichip module yield (Ym ) and resultant shipped multichip module yield (Yms ) based on the new IC yield formula are provided.

Copyright © 1995 by The American Society of Mechanical Engineers
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