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RESEARCH PAPERS

A New Model for Accelerated Thermal Cycle Testing With Application to TAB Leads and PCB PTHs

[+] Author and Article Information
R. G. Bayer

Vestal, NY 13850

J. Electron. Packag 116(1), 16-22 (Mar 01, 1994) (7 pages) doi:10.1115/1.2905487 History: Received April 02, 1993; Revised November 01, 1993; Online April 28, 2008

Abstract

A model for thermal fatigue that accounts for both plastic and elastic strains and a mean strain is developed. The model is based on a combination of the generalized Coffin-Manson Equation and the Goodman diagram for fatigue. This model was applied to two accelerated thermal cycling tests—one was for TAB leads; the other, unfilled PTHs at TCM sites in PC boards. Good agreement between the model and data was found. In addition, an existing industry model, which is based solely on plastic strain, is compared to the proposed model and the observed behavior in these two tests. It was concluded that both the effects of elastic and plastic strains and a mean strain are needed to explain the results of these evaluations.

Copyright © 1994 by The American Society of Mechanical Engineers
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