Reliable Ceramic Window Design for Electronic Devices

[+] Author and Article Information
Hsien-Yang Yeh

Department of Mechanical Engineering, California State University, Long Beach, Long Beach, California 90840

J. Electron. Packag 114(3), 349-352 (Sep 01, 1992) (4 pages) doi:10.1115/1.2905462 History: Received March 27, 1989; Revised April 08, 1992; Online April 28, 2008


The effective operations of a high voltage vacuum electronic device, such as a traveling wave tube, depends on its ability to maintain high vacuum environments. However, during temperature tests, some tubes fail because of vacuum leaks through cracks in the ceramic window. It is believed that these leaks result from RF heating at the center conductor, which caused the ceramic to crack. To obtain a general understanding of the stress field in the window structure, a closed from analytical approach is imperative. However, due to the complex nature of the problem, only the first order engineering approximation is used in this preliminary study. The theory of linear elastic fracture mechanics and the existing solutions from elastic circular plates are useful for understanding the cause of ceramic window cracks. Some simple design references have also been developed for the design of reliable ceramic windows for traveling wave tubes.

Copyright © 1992 by The American Society of Mechanical Engineers
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